Kanagawa, Japan

Yutaka Mikuriya

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Nissan Motor Corp.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yutaka Mikuriya. Retrieved from https://idiyas.com/inventor/yutaka-mikuriya-7eq4m7js

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yutaka Mikuriya: Inventor of a Cargo Compartment Monitoring System.

Introduction

Yutaka Mikuriya is an inventor based in Kanagawa, Japan, associated with Nissan Motor Corporation. His patent work addresses monitoring cargo in a vehicle and alerting users when cargo may have been left behind.

Latest Patents

Mikuriya is credited with 1 patent: “Cargo Compartment Monitoring Device and Cargo Compartment Monitoring Method.” The invention acquires information about cargo in a vehicle’s cargo compartment, including its position, and associates newly loaded cargo with a user boarding the vehicle. It checks whether the cargo information has been updated and whether the vehicle has reached that user’s destination. If the information has not been updated by the time the vehicle arrives, the system issues an alert.

Career Highlights

Mikuriya’s listed patent reflects work on vehicle-based cargo monitoring and user notifications. The invention is designed to help identify cargo that may remain in a vehicle after a passenger reaches their destination.

Collaborations

Mikuriya’s listed coworkers include Eijo Iwasaki and Kotaro Chiba. The available information does not specify their roles in the patent or their contributions to the invention.

Conclusion

Yutaka Mikuriya’s patent focuses on using cargo information and destination-based alerts to help prevent belongings from being left in a vehicle.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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