Company Filing History:
Years Active: 2015-2021
Title: Yutaka Dejima: Innovator in Specimen Analysis Technology
Introduction
Yutaka Dejima, an inventive mind based in Kyoto, Japan, has made significant strides in the field of specimen analysis through his innovative patents. With a total of two patents to his name, Dejima has specialized in the development of advanced apparatuses that enhance measurement and analytical capabilities.
Latest Patents
Dejima's latest patents include a **Specimen Analysis Apparatus** and an **Analyzing Device**. The specimen analysis apparatus is equipped with a measuring part, a display part, and a control part. The control part manages the measuring functions and features an alarm display region that alerts users to failures within the measuring part, alongside a recovery operation display region that guides users on how to address these issues. It also prioritizes the display of multiple recovery operations according to urgency.
The analyzing device distinguishes the position of a measurement cell without relying on electrical position sensors. It features a cell switching mechanism that controls the movement between a measurement position and an evacuating position, employing different speeds for enhanced accuracy. Notably, a distinguishing mechanism detects speed variations using measurement light, allowing for effective identification of the cell positions.
Career Highlights
Yutaka Dejima is currently employed at Horiba, Ltd., a company renowned for its contributions to analytical and measuring instruments. His work is pivotal in advancing the reliability and efficiency of specimen analysis technologies, reinforcing the company’s reputation in the industry.
Collaborations
Throughout his career, Dejima has collaborated with notable coworkers, including Kimihiko Arimoto and Daisuke Kitaki. Their combined expertise and focused efforts have driven the success of various innovative projects within their field.
Conclusion
Yutaka Dejima stands out as a remarkable inventor whose contributions to specimen analysis technology are shaping the future of measurement science. His patents reflect a commitment to innovation and efficiency, promising significant advancements for research and industrial applications in Japan and beyond.