The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2021
Filed:
Jul. 13, 2018
Applicant:
Horiba, Ltd., Kyoto, JP;
Inventor:
Yutaka Dejima, Kyoto, JP;
Assignee:
HORIBA, Ltd., Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 40/63 (2018.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G16H 40/63 (2018.01); G01N 35/00623 (2013.01); G01N 35/00663 (2013.01); G01N 35/00722 (2013.01); G01N 2035/009 (2013.01); G01N 2035/0091 (2013.01); G01N 2035/00673 (2013.01);
Abstract
The specimen analysis apparatus of the present invention comprises a measuring part; a display part; and a control part. The control part controls the measuring parts, displays on the display part an alarm display region displaying an alarm of a failure occurred in the measuring part, and a recovery operation display region displaying a recovery operation to cancel the alarm displayed in the alarm display region, and, when multiple alarms have occurred, displays multiple recovery operations to cancel them in the order of from higher priority to lower priority.