Tokyo, Japan

Yusuke Yamashina

USPTO Granted Patents = 5 

Average Co-Inventor Count = 2.5

ph-index = 1


Company Filing History:


Years Active: 2017-2024

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5 patents (USPTO):Explore Patents

Title: Yusuke Yamashina: Innovator in Inspection Systems and Edge Devices

Introduction

Yusuke Yamashina is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the fields of inspection systems and edge devices, holding a total of 5 patents. His innovative work focuses on enhancing the efficiency and reliability of monitoring systems in various industrial applications.

Latest Patents

Yamashina's latest patents include an inspection system designed for fabricated objects formed by layering powder. This system features an acquisition unit that captures images of the surface of each layer, an identification unit that detects defects, and a determination unit that identifies abnormalities when defects occur at the same position across multiple layers. Another notable patent is for an edge device that automatically establishes a connection with a remote monitoring device when an abnormality is detected in a plant. This device includes a controller that identifies the abnormality and a connection establishment unit that allows remote access for monitoring and manipulation of the observation target device.

Career Highlights

Throughout his career, Yusuke Yamashina has worked with esteemed companies such as Mitsubishi Heavy Industries Limited and Mitsubishi Heavy Industries Mechatronics Systems, Ltd. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in technology.

Collaborations

Yamashina has collaborated with notable colleagues, including Takahiro Tachibana and Akira Kono. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.

Conclusion

Yusuke Yamashina's contributions to inspection systems and edge devices highlight his role as a key innovator in the field. His patents reflect a commitment to improving industrial monitoring and ensuring operational efficiency.

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