This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Kabushiki Kaisha Toshiba. Active years: 2015.
Company Filing History:
Years Active: 2015
Title: Yusuke Iida - Innovator in Pattern Inspection Technology.
Introduction
Yusuke Iida is a notable inventor based in Yokkaichi, Japan. He has made significant contributions to the field of pattern inspection technology. His innovative approach has led to the development of a unique method and apparatus for inspecting patterns on substrates.
Latest Patents
Yusuke Iida holds a patent for a "Pattern inspection method and pattern inspection apparatus." This invention involves applying light to a substrate that includes an inspection target pattern under various optical conditions. The method detects reflected light from the substrate to acquire pattern images for each optical condition. It outputs a gray value difference between the pattern image and a reference image, allowing for the specification of defect positions in the stacking direction of the stacked film. This technology is particularly useful for detecting defects on the surface of stacked films.
Career Highlights
Yusuke Iida is associated with Kabushiki Kaisha Toshiba, a leading company in technology and innovation. His work at Toshiba has allowed him to focus on advancing inspection technologies that enhance product quality and reliability.
Collaborations
Yusuke Iida collaborates with Kiminori Yoshino, contributing to the development of innovative solutions in their field. Their teamwork exemplifies the importance of collaboration in driving technological advancements.
Conclusion
Yusuke Iida's contributions to pattern inspection technology highlight his role as an innovator in the industry. His patent reflects a commitment to improving inspection methods, which is crucial for maintaining high standards in manufacturing processes.