Washington, DC, United States of America

Yushra F Thanzeel

This inventor holds 1 USPTO granted patent. Top assignee: Georgetown University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yushra F Thanzeel. Retrieved from https://idiyas.com/inventor/yushra-f-thanzeel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yushra F. Thanzeel and a Patent for Chiral Analyte Sensing

Introduction

Yushra F. Thanzeel is an inventor associated with Georgetown University in Washington, DC. His patent work addresses a method for measuring the chirality and concentration of chiral analytes in a sample.

Latest Patents

Thanzeel is credited with 1 patent: “Quantitative Chirality and Concentration Sensing of Chiral Analytes Using a Relay Assay.” The method uses a probe that can bind irreversibly to a chiral analyte, if present, and an indicator that binds to any excess probe. A chiroptical technique can then determine the analyte’s absolute configuration or enantiomeric composition, while a non-chiroptical technique determines its concentration. This relay-assay approach combines complementary measurements in a single analytical method.

Career Highlights

The available information identifies Thanzeel’s work with Georgetown University and highlights his contribution to analytical sensing through this patent. The invention focuses on obtaining information about both the stereochemical properties and the amount of an analyte.

Collaborations

Christian Wolf is identified as Thanzeel’s coworker. The provided information does not specify their roles or describe particular joint projects.

Conclusion

Yushra F. Thanzeel’s patent presents a relay-assay method for assessing the chirality and concentration of chiral analytes, reflecting an innovation in analytical measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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