Nanjing, China

Yushi Guo

This inventor holds 1 USPTO granted patent. Top assignee: Nanjing Huajie Imi Technology Co., Ltd. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yushi Guo. Retrieved from https://idiyas.com/inventor/yushi-guo-jzpuq7gd

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Yushi Guo - Innovator in Depth Image Processing

Introduction

Yushi Guo is a prominent inventor based in Nanjing, China. He has made significant contributions to the field of image processing, particularly through his innovative methods for background modeling and foreground extraction.

Latest Patents

Yushi Guo holds a patent for a "Background modeling and foreground extraction method based on depth image." This invention involves a series of steps that include acquiring a depth image, initiating and updating a real-time depth background model, and extracting a foreground image based on this model. The method is characterized by its stability, high efficiency, and superiority in processing positional relationships compared to traditional color image modeling methods. It simplifies implementation steps and greatly enhances overall performance.

Career Highlights

Yushi Guo is associated with Nanjing Huajie Imi Technology Co., Ltd., where he applies his expertise in image processing. His work has been instrumental in advancing the capabilities of depth image analysis.

Collaborations

Yushi collaborates with talented coworkers, including Hang Wang and Li Li, who contribute to the innovative environment at Nanjing Huajie Imi Technology Co., Ltd.

Conclusion

Yushi Guo's contributions to depth image processing exemplify the impact of innovation in technology. His patent reflects a significant advancement in the field, showcasing his dedication to improving image analysis methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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