Anaheim, CA, United States of America

Yury N Golubev

This inventor holds 1 USPTO granted patent. Top assignee: Raytheon Company. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yury N Golubev. Retrieved from https://idiyas.com/inventor/yury-n-golubev

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Yury N Golubev: Innovator in Ionosphere Detection

Introduction

Yury N Golubev is a notable inventor based in Anaheim, CA. He has made significant contributions to the field of ionosphere research. His innovative work focuses on methods for detecting plasma depletion in the ionosphere.

Latest Patents

Golubev holds a patent for a "Method and apparatus for ionosphere depletion detection." This method involves comparing the large-scale ionosphere trend with a local temporal slope of vertical or slant delay. In one example, the local temporal slope of delay is calculated using phase data extracted from GPS signals at a GPS receiver. The large-scale trend is determined from broadcast ionosphere grid point delay data. He has 1 patent to his name.

Career Highlights

Yury N Golubev is currently employed at Raytheon Company, where he continues to advance his research and development efforts. His work has implications for various applications, including telecommunications and navigation systems.

Collaborations

Golubev has collaborated with Gregory Sechong Um, contributing to the advancement of ionosphere detection technologies.

Conclusion

Yury N Golubev's innovative methods for ionosphere detection highlight his expertise and commitment to advancing scientific knowledge in this critical area. His contributions are valuable to both the scientific community and practical applications in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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