Lyon, France

Yuriy Zakharko

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Centre National De La Recherche Scientifique, National Institute of Health and Medical Research. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuriy Zakharko. Retrieved from https://idiyas.com/inventor/yuriy-zakharko

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


 

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Yuriy Zakharko

Introduction

Yuriy Zakharko is a notable inventor based in Lyons, France. He has made significant contributions to the field of technology, particularly in the area of detecting interactions with dielectric layers. His work has implications for various applications in science and engineering.

Latest Patents

Yuriy Zakharko holds a patent for a method that detects the interaction of at least one entity with a dielectric layer. This invention relates to a technique for identifying interactions between entities and dielectric layers that contain different electron levels within the energy band gap. The method involves several steps that enhance the understanding of these interactions.

Career Highlights

Throughout his career, Yuriy has worked with prestigious organizations, including the Centre National de la Recherche Scientifique and the Institut National de la Santé et de la Recherche Médicale. His experience in these institutions has allowed him to develop and refine his innovative ideas.

Collaborations

Yuriy has collaborated with talented individuals such as Tetyana Nichiporuk and Tetiana Serdiuk. These partnerships have contributed to the advancement of his research and inventions.

Conclusion

Yuriy Zakharko's work exemplifies the spirit of innovation and dedication to advancing technology. His contributions to the field of dielectric interactions are noteworthy and reflect his commitment to scientific progress.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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