Company Filing History:
Years Active: 2010
Title: Innovations of Yunqing Zhu in Surface Measurement Technology
Introduction
Yunqing Zhu is an accomplished inventor based in Andover, MA, known for his significant contributions to measurement technology. He has developed a unique patent that enhances the accuracy and efficiency of surface contour measurement systems. His work is pivotal in advancing the field of optical measurement.
Latest Patents
Yunqing Zhu holds a patent for a "Multiple Channel Interferometric Surface Contour Measurement System." This innovative system includes a multiple channel interferometer projector, a digital camera, and a processor. The projector features two or more interferometer channels, each with a spatially separate optical axis. This design allows each channel to project a fringe pattern onto the surface of an object being measured. The digital camera captures image data of these fringe patterns, while the processor manages the projection of fringe patterns with varying spatial frequencies, adjusts their phases, and generates surface contour data based on the camera's image data. This system offers numerous advantages over traditional single-channel interferometric systems, such as reduced sensitivity to optical noise, improved stability, and enhanced measurement accuracy.
Career Highlights
Yunqing Zhu is associated with Dimensional Photonics International, Inc., where he applies his expertise in optical measurement technologies. His innovative approach has positioned him as a key figure in the development of advanced measurement systems. His work not only contributes to the company's success but also to the broader field of photonics.
Collaborations
Yunqing Zhu collaborates with notable colleagues, including Robert F. Dillon and Neil Judell. These partnerships foster an environment of innovation and creativity, leading to advancements in measurement technologies.
Conclusion
Yunqing Zhu's contributions to the field of surface measurement technology through his innovative patent demonstrate his expertise and commitment to advancing optical measurement systems. His work continues to influence the industry positively.
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