The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2010
Filed:
Apr. 04, 2006
Robert F. Dillon, Chelmsford, MA (US);
Neil Judell, Newtonville, MA (US);
Yi Qian, Acton, MA (US);
Yunqing Zhu, Andover, MA (US);
D. Scott Ackerson, Windham, NH (US);
Gurpreet Singh, Providence, RI (US);
Robert F. Dillon, Chelmsford, MA (US);
Neil Judell, Newtonville, MA (US);
Yi Qian, Acton, MA (US);
Yunqing Zhu, Andover, MA (US);
D. Scott Ackerson, Windham, NH (US);
Gurpreet Singh, Providence, RI (US);
Dimensional Photonics International, Inc., Wilmington, MA (US);
Abstract
Described is a multiple channel interferometric surface contour measurement system. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. The projector includes two or more interferometer channels. Each channel has an optical axis spatially separate from the optical axes of the other channels. Each channel projects a fringe pattern onto the surface of an object to be measured. Image data for the fringe patterns projected on the object surface are acquired by the digital camera. The processor controls the projection of the fringe patterns of different spatial frequencies, adjusts the phase of each fringe pattern and generates surface contour data in response to the camera image data. The multiple channel interferometric surface contour measurement system provides numerous advantages over conventional single channel interferometric systems, including reduced sensitivity to optical noise, improved stability and increased measurement accuracy.