Yunmei Chen

Title: Innovations and Contributions of Inventor Yunmei Chen

Introduction

Yunmei Chen is a notable inventor based in Gainesville, FL (US). He has made significant contributions to the field of microscopy and imaging technologies. With a total of 4 patents, his work has advanced the capabilities of scanning probe microscopy and computed tomography.

Latest Patents

One of his latest patents is titled "Method for error correction in scanning probe microscopy." This patent discloses a scanning probe microscope system and method for producing images at fast scan rates while reducing oscillation artifacts. The method employs an inverse consistent image registration technique to align forward and backward scan traces for each line of the scanning microscope image. Additionally, it combines these aligned traces using a weighting factor that favors the smoother scan trace. Another significant patent is "Common-mask guided image reconstruction for enhanced four-dimensional cone-beam computed tomography." This system constructs images representing a 4DCT sequence of an object from multiple projections taken from various angles and times. It includes a processor that iteratively processes projections to reconstruct image portions based on the object's dynamics.

Career Highlights

Yunmei Chen has worked with reputable organizations, including the University of Florida Research Foundation and Invivo Corporation. His experience in these institutions has allowed him to collaborate on innovative projects that push the boundaries of imaging technology.

Collaborations

Some of his notable coworkers include Hao Zhang and Feng Huang. Their collaborative efforts have contributed to the success of various projects and patents in the field.

Conclusion

Yunmei Chen's contributions to the fields of microscopy and imaging are noteworthy. His innovative patents and collaborations reflect his commitment to advancing technology. His work continues to influence the development of new imaging techniques and methodologies.