This inventor holds 4 USPTO granted patents and 1 published patent application. Top assignees: Inventec Corp., Inventec (Pudong) Technology Corporation. Active years: 2007-2023.
Company Filing History:
4 out of 1,634 
3 out of 677 
Years Active: 2007-2023
Title: Yung-Sen Lee: Innovator in Radiation Susceptibility Testing
Introduction
Yung-Sen Lee is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of radiation susceptibility testing, holding a total of four patents. His innovative methods have advanced the understanding and testing of devices under radiation exposure.
Latest Patents
Yung-Sen Lee's latest patents include a method and system for testing radiation susceptibility. This method involves transmitting radiation waves to a device under test and measuring the resulting voltage. The process includes outputting a reference voltage to a coupling device, which generates a second voltage. The reference voltage is then adjusted to approximate the second voltage to the first voltage. This adjusted reference voltage is stored and used to simulate the impact of radiation waves on the device under test. The system is designed to determine the status of the device based on control signals received after exposure.
Career Highlights
Throughout his career, Yung-Sen Lee has worked with prominent companies such as Inventec Corporation and Inventec (Pudong) Technology Corporation. His experience in these organizations has allowed him to refine his skills and contribute to significant advancements in technology.
Collaborations
Yung-Sen Lee has collaborated with talented individuals in his field, including Yuan-Ho Chen and I-Lin Tsai. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.
Conclusion
Yung-Sen Lee's work in radiation susceptibility testing showcases his dedication to innovation and technology. His patents reflect a deep understanding of the challenges faced in this area and provide valuable solutions for testing devices under radiation exposure.