Yung C Lee

Title: The Innovations of Yung C. Lee: A Pioneer in Particle Counting and Scanning Technologies

Introduction

Yung C. Lee, located in Cupertino, California, is a distinguished inventor known for his contributions to the fields of particle counting and semiconductor scanning technologies. With a portfolio boasting two patents, Lee has shown an impressive ability to merge creativity with practicality in his inventions.

Latest Patents

Among Lee's notable inventions is a patented “Method for synchronizing particle counters to external events.” This innovation presents an advanced method and apparatus designed to synchronize particle counts with process events, using trigger signals linked not to time but to specific process occurrences. By allowing the controller of the particle counter to subdivide process events into sub-intervals, this invention permits detailed profiling of particle counts throughout these events. Additionally, this system can manage multiple trigger signals from various sources, each identifiable by a unique source tag, thereby maintaining precise particle counts along with corresponding time-stamps.

Another significant patent is the “Low cost stage for raster scanning of semiconductor wafers.” This pioneering raster scan apparatus integrates a scanning assembly that executes sinusoidal motion along one direction while making fine adjustments perpendicularly. It utilizes a piezoelectric bimorph to initiate the scanning motion and a Hall effect sensor to determine the instantaneous position of the assembly. The ability to adaptively adjust the scanning motion based on feedback from the Hall effect sensor ensures the refinement of the scanning process, making it highly efficient for semiconductor applications.

Career Highlights

Yung C. Lee is currently associated with High Yield Technology, a company that focuses on innovative solutions in semiconductor manufacturing. His work demonstrates the practical application of theoretical concepts, leading to advancements that benefit industries reliant on precision and efficiency.

Collaborations

Throughout his career, Lee has collaborated with notable colleagues such as James B. Stolz and Peter G. Borden. These partnerships have further enriched the innovative processes at High Yield Technology and propelled the development of groundbreaking inventions that address complex challenges faced in technology today.

Conclusion

Yung C. Lee stands out as a prominent inventor whose work reflects a commitment to enhancing technology in particle counting and semiconductor processing. His patents not only contribute to the growth of High Yield Technology but also signify a milestone in the ongoing innovation landscape. Lee's journey highlights the importance of creativity and collaboration in pushing the boundaries of what is possible in technology.