High Yield Technology

Yung C Lee

Peter G Borden

James B Stolz

George L Coad

Mark A Nokes

Ron B Whitney

A method and an apparatus for synchronizing particle counts to process events provide a trigger signal related to the process events in lieu of a time-based trigger signal. In one embodiment, the controller to a particle counter further subdivides a process event into sub-intervals to allow profiling of particle counts during the process event. In one embodiment, the controller of the particle counter receives multiple trigger signals corresponding to multiple trigger signal sources, each trigger signal source being identified by a source tag. Particle counts and time-stamps are maintained for each source of the trigger signals.

Method for synchronizing particle counters to external events

A raster scan apparatus provides a scanning assembly capable of moving in a sinusoidal motion along a first direction and stepping in fine steps in a second direction perpendicular to the first direction. In one embodiment, a piezoelectric bimorph sets in scanning motion a scanning assembly formed by a wafer holder and leaf springs. The amplitude of the scanning motion is controlled by a voltage applied across the piezoelectric bimorph. A Hall effect sensor provides an output signal indicating the instantaneous location of the scanning assembly in motion. The output signal of the Hall effect sensor is compared against a predetermined threshold to provide a trigger signal for synchronization. The output signal of the Hall effect sensor is also fed back to the source of sinusoidal voltage to adaptively adjust the sinusoidal voltage so as to achieve a predetermined amplitude for the scanning motion.

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Cupertino, CA, United States of America

Yung C Lee