Beijing, China

Yunfeng Dai

This inventor holds 1 USPTO granted patent. Top assignee: University of Leeds. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yunfeng Dai. Retrieved from https://idiyas.com/inventor/yunfeng-dai-igyfd35d

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Yunfeng Dai: Innovator in Electrical Impedance Tomography

Introduction

Yunfeng Dai is a prominent inventor based in Beijing, China. He has made significant contributions to the field of electrical impedance tomography (EIT). His innovative work focuses on developing systems that enhance the acquisition and processing of data from two-phase flows.

Latest Patents

Yunfeng Dai holds a patent for an EIT data processing system and method. This system is designed for acquiring and processing data from two-phase flows. It comprises a dual-plane sensor, multiple digital signal processing modules arranged in a data pipeline processing configuration, and several data acquisition subsystems that communicate with the first digital signal processing module. This invention showcases his expertise in advancing EIT technology.

Career Highlights

Yunfeng Dai is affiliated with the University of Leeds, where he continues to engage in research and development. His work at the university allows him to collaborate with other experts in the field and contribute to academic advancements in technology.

Collaborations

Some of his notable coworkers include Yixin Ma and Nigel Thomas Holliday. Their collaboration enhances the research environment and fosters innovation in their respective fields.

Conclusion

Yunfeng Dai is a key figure in the realm of electrical impedance tomography, with a focus on improving data processing systems. His contributions are vital for the advancement of technology in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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