Singapore, Singapore

Yunfei Bai

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yunfei Bai. Retrieved from https://idiyas.com/inventor/yunfei-bai-efq5p8uv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Yunfei Bai and the “Endpoint Access Manager” Patent.

Introduction

Yunfei Bai is an inventor associated with Singapore and International Business Machines Corporation (IBM). Bai’s patent work includes a system for assessing whether an endpoint device meets compliance standards before it accesses a resource.

Latest Patents

Bai is credited with 1 patent: “Endpoint Access Manager.” The invention describes a method, computer program product, and system for evaluating endpoint compliance. Processors receive an endpoint certificate containing a device fingerprint, determine the device’s compliance level, validate its credentials, and assess whether it meets the required standards based on that information.

Career Highlights

Bai’s listed patent reflects work on endpoint security and access management. By combining certificate information, compliance assessment, and credential validation, the invention addresses how organizations can evaluate devices requesting access to protected resources.

Collaborations

Bai’s listed coworkers include Christopher John Hockings and Codur Sreedhar Pranam. The available information associates Bai with IBM but does not specify the coworkers’ roles in the patent.

Conclusion

Yunfei Bai’s patent on endpoint access management focuses on evaluating device identity, credentials, and compliance before granting access to resources.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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