Cambridge, MA, United States of America

Yunan Gao

This inventor holds 1 USPTO granted patent. Top assignee: Massachusetts Institute of Technology. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yunan Gao. Retrieved from https://idiyas.com/inventor/yunan-gao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Yunan Gao - Innovator in Nonlinear Optical Imaging

Introduction

Yunan Gao is a prominent inventor based in Cambridge, MA (US). He has made significant contributions to the field of nonlinear optical imaging. His innovative work focuses on advancing imaging techniques that can enhance our understanding of material properties.

Latest Patents

Yunan Gao holds a patent for his invention titled "Phase modulated Optical Parametric Amplification Imaging (p-OPA)." This technology is designed to determine the magnitude and the sign of the second-order nonlinear susceptibility of a material, as well as its spatial variation. This patent represents a significant advancement in the field of optical imaging.

Career Highlights

Yunan Gao is affiliated with the Massachusetts Institute of Technology, where he continues to push the boundaries of research in nonlinear optics. His work has garnered attention for its potential applications in various scientific and industrial fields.

Collaborations

Yunan has collaborated with notable colleagues, including William Alfred Tisdale and Aaron Jacob Goodman. These partnerships have contributed to the development and refinement of his innovative imaging techniques.

Conclusion

Yunan Gao's contributions to nonlinear optical imaging exemplify the impact of innovative research in advancing technology. His work not only enhances our understanding of material properties but also paves the way for future advancements in imaging techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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