Canfield, OH, United States of America

Yun Xia

This inventor holds 1 USPTO granted patent. Top assignee: Pioneer Hi-Bred International, Inc.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yun Xia. Retrieved from https://idiyas.com/inventor/yun-xia-1a2ibds7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Yun Xia: Innovator in Soybean Resistance

Introduction

Yun Xia is a notable inventor based in Canfield, OH (US). He has made significant contributions to the field of agricultural biotechnology, particularly in enhancing soybean plant resistance to diseases.

Latest Patents

Yun Xia holds a patent titled "Genetic loci associated with Frogeye Leaf Spot resistance and Brown Stem Rot resistance and methods of use." This patent provides various methods and compositions for identifying and selecting soybean plants or germplasm with improved resistance to Frogeye Leaf Spot and Brown Stem Rot. The methods include detecting marker loci associated with resistance and crossing selected soybean plants to enhance their resilience.

Career Highlights

Yun Xia is affiliated with Pioneer Hi-Bred International, Inc., where he applies his expertise in genetic research to develop innovative solutions for soybean cultivation. His work focuses on improving crop resilience, which is crucial for sustainable agriculture.

Collaborations

Yun has collaborated with notable colleagues, including Martin Arthur Fabrizius and Feng Han, to advance research in soybean genetics and disease resistance.

Conclusion

Yun Xia's contributions to agricultural biotechnology, particularly in soybean disease resistance, highlight his role as an innovator in the field. His work not only enhances crop resilience but also supports sustainable agricultural practices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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