Seoul, South Korea

Yun Soo Heo

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Alto, Inc.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yun Soo Heo. Retrieved from https://idiyas.com/inventor/yun-soo-heo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations of Yun Soo Heo in Reflector Manufacturing

Introduction

Yun Soo Heo is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of manufacturing, particularly in the development of reflectors. His innovative approach has led to the creation of a unique manufacturing method that enhances light distribution and minimizes foreign substance attachment.

Latest Patents

Yun Soo Heo holds 1 patent for his invention titled "Manufacturing method of the reflector." This patent outlines a comprehensive process that includes several key steps. The method involves injecting a plastic product through a specially designed mold, cleaning the surface with ultrasonic waves, performing plasma surface treatment, depositing an aluminum thin film, and finally applying an antistatic top coating.

Career Highlights

He is currently associated with Alto, Inc., where he continues to innovate and develop new manufacturing techniques. His work has been instrumental in advancing the technology behind reflectors, making them more efficient and effective in various applications.

Conclusion

Yun Soo Heo's contributions to reflector manufacturing demonstrate his commitment to innovation and excellence in the field. His patented method not only improves product performance but also addresses common challenges in the manufacturing process.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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