Kaohsiung, Taiwan

Yun-Sian Jhu

This inventor holds 1 USPTO granted patent. Top assignee: Primax Electronics Ltd.. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yun-Sian Jhu. Retrieved from https://idiyas.com/inventor/yun-sian-jhu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Innovations of Yun-Sian Jhu

Introduction

Yun-Sian Jhu is a notable inventor based in Kaohsiung, Taiwan. He has made significant contributions to the field of automatic exposure metering. His innovative approach simplifies the process of determining exposure values for photographs.

Latest Patents

Yun-Sian Jhu holds 1 patent for his invention titled "Metering method of automatic exposure." This invention provides a metering method for determining an exposure value of a picture that includes a subject. The method involves a subject detecting step that utilizes focus values to identify the subject, followed by an exposure value calculating step that employs an auto exposure metering function. This invention aims to offer a simpler and more compact metering method.

Career Highlights

Yun-Sian Jhu is currently associated with Primax Electronics Ltd., where he continues to innovate and contribute to advancements in technology. His work has garnered attention for its practicality and efficiency in the field of photography.

Collaborations

Some of his notable coworkers include Chin-Chih Lin and Jui-Hsiang Lo. Their collaborative efforts contribute to the innovative environment at Primax Electronics Ltd.

Conclusion

Yun-Sian Jhu's contributions to the field of automatic exposure metering highlight his innovative spirit and dedication to improving photographic technology. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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