Vancouver, Canada

Yun San Fung

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Ivanti, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yun San Fung. Retrieved from https://idiyas.com/inventor/yun-san-fung

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yun San Fung and Digital Employee Experience Innovation.

Introduction

Yun San Fung is an inventor associated with Vancouver, Canada, and Ivanti, Inc. His patent work addresses how organizations can monitor and improve users’ digital experiences with managed devices.

Latest Patents

Fung is associated with one patent, Digital employee experience index. The invention describes a method for managing a device based on digital experience metrics. It develops a calculated device index (CDI) from weighted, normalized attribute values that reflect a user’s experience with the device. The method establishes a normal device index range (NDIR), monitors current device attributes, calculates the CDI, and compares it with that range. If the CDI falls outside the normal range, the system identifies an anomalous contributing attribute and takes action to mitigate the issue.

Career Highlights

Fung’s patent highlights an approach to device-level management that uses measurable experience indicators to detect potential problems and guide corrective action. His work is associated with Ivanti, Inc. The patent record provided identifies 1 patent.

Collaborations

Fung’s listed coworker is Mantinder Jit Singh. The available information does not specify the nature or scope of their collaboration.

Conclusion

Yun San Fung’s patent presents a data-driven method for identifying device issues that may affect employee digital experience and responding to them.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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