Carlsbad, CA, United States of America

Yun Luo

This inventor holds 2 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignee: Gemological Institute of America. Active years: 2024-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yun Luo. Retrieved from https://idiyas.com/inventor/yun-luo-o8jxr7jv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2024-2025

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2 patents (USPTO):Explore Patents

Title: Innovations by Yun Luo in Gemstone Analysis

Introduction

Yun Luo is an accomplished inventor based in Carlsbad, CA (US). He has made significant contributions to the field of gemstone analysis, holding two patents that enhance the understanding of diamond appearances.

Latest Patents

Yun Luo's latest patents focus on the detection and grading of the effect of blue fluorescence on diamond appearances. These systems and methods are designed to analyze images of gemstones, allowing for the automatic assignment of a haziness and/or fluorescence grade. This is achieved through contrast analysis on pixelated, digital images of the gemstones.

Career Highlights

Yun Luo is associated with the Gemological Institute of America, Inc. (GIA), where he applies his expertise in gemstone analysis. His work has been instrumental in advancing the methodologies used in the grading of diamonds.

Collaborations

Some of his notable coworkers include David Nelson and Troy Ardon, who contribute to the innovative environment at GIA.

Conclusion

Yun Luo's inventions and patents represent a significant advancement in the field of gemstone analysis, particularly in understanding the effects of fluorescence on diamonds. His work continues to influence the industry and improve grading techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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