Daejeon, South Korea

Yun Jae Kim

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Sk on Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yun Jae Kim. Retrieved from https://idiyas.com/inventor/yun-jae-kim-ew5lfdrw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yun Jae Kim and Battery Electrode Inspection Innovation.

Introduction

Yun Jae Kim is an inventor based in Daejeon, South Korea, and is associated with SK On Co., Ltd. His patent work addresses the inspection of battery cell-type electrodes, with a focus on identifying abnormalities in their alignment.

Latest Patents

Kim is named on one patent: “Method and Device for Detecting Abnormality in Alignment of Battery Cell Type Electrodes.” The invention describes acquiring a three-dimensional image of a specimen containing battery cell-type electrodes and processing that image with one or more determination models. These models may use deep learning, rule-based methods, or both to assess the electrodes’ arrangement and detect abnormalities based on the results.

Career Highlights

Kim’s recorded patent contribution concerns applying image analysis and determination models to battery electrode inspection. The approach is designed to evaluate electrode arrangement from three-dimensional imaging.

Collaborations

Kim’s listed coworkers include Dong Whan Shin and Kang San Kim. The patent information provided does not specify their individual roles in the invention.

Conclusion

Yun Jae Kim’s patent work at SK On Co., Ltd. focuses on detecting battery electrode alignment abnormalities through three-dimensional imaging and model-based analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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