Guangzhou, China

Yukuan Liu

This inventor holds 1 USPTO granted patent. Top assignee: Guangdong Polytechnic Normal University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yukuan Liu. Retrieved from https://idiyas.com/inventor/yukuan-liu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations of Yukuan Liu in Binary Dot Matrix Code Identification

Introduction

Yukuan Liu is an accomplished inventor based in Guangzhou, China. He has made significant contributions to the field of image processing and identification technologies. His innovative work focuses on methods for identifying binary dot matrix codes on mold surfaces.

Latest Patents

Yukuan Liu holds a patent for a "Method for identifying binary dot matrix code on mold surface." This patent outlines a comprehensive process that includes capturing multiple images of binary dot matrix codes, training a YOLOv8 network model, and utilizing advanced detection techniques to derive binary-encoded character information. The method emphasizes the importance of accurate image processing and transformation to achieve reliable results.

Career Highlights

Yukuan Liu is affiliated with Guangdong Polytechnic Normal University, where he contributes to research and development in his field. His work has garnered attention for its practical applications in various industries, particularly in manufacturing and quality control.

Collaborations

Yukuan Liu collaborates with notable colleagues such as Peng Liang and Hong Zhang. Their combined expertise enhances the research output and innovation potential within their projects.

Conclusion

Yukuan Liu's contributions to the identification of binary dot matrix codes represent a significant advancement in image processing technology. His innovative methods and collaborative efforts continue to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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