Tokyo, Japan

Yukiyoshi Koda

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yukiyoshi Koda. Retrieved from https://idiyas.com/inventor/yukiyoshi-koda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:

goldMedal1 out of 834,570 
Other
 patents

Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Yukiyoshi Koda and Semiconductor Diagnostics.

Introduction

Yukiyoshi Koda is an inventor associated with Tokyo, Japan. His recorded patent focuses on a semiconductor module designed to diagnose multiple chips mounted on a single substrate.

Latest Patents

Koda’s listed patent, “Semiconductor module,” describes a system for diagnosing the status of multiple semiconductor chips. The module includes a mode signal pin that receives a request to begin diagnostics and a result output pin that reports diagnostic results. Each chip has its own diagnostic circuit, while a diagnosis controller coordinates the circuits so the chips can be tested either in parallel or serially. This design provides a way to assess all chips within the module.

Career Highlights

The available information identifies 1 patent associated with Koda. The patent highlights his work on integrated semiconductor diagnostics and coordinated testing.

Collaborations

Koda’s listed coworkers include Mari Shibayama and Ryuji Ohmura. The available details do not specify their roles in the patent or their working relationship with him.

Conclusion

Yukiyoshi Koda’s recorded invention addresses the practical challenge of diagnosing multiple semiconductor chips on a shared substrate, with a controller that supports both parallel and serial testing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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