Saitama, Japan

Yukiya Miyachi

This inventor holds 1 USPTO granted patent. Top assignee: Fuji Photo Film Company, Limited. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yukiya Miyachi. Retrieved from https://idiyas.com/inventor/yukiya-miyachi-t8bufloe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Innovations of Yukiya Miyachi

Introduction

Yukiya Miyachi is a notable inventor based in Saitama, Japan. He has made significant contributions to the field of thermal recording technology. His innovative approach has led to the development of a unique thermal head design that enhances the efficiency of color thermal recording.

Latest Patents

Miyachi holds a patent for a thermal head that features a layer of thermal insulator. This insulator is strategically placed on at least one of the electrically insulating substrate, adhesive layer, and heat dissipating plate. The design ensures that heat generated at the heating elements is effectively managed, preventing condensation of steam or vapor on the protective layer. This innovation helps avoid printing failures during thermal recording processes.

Career Highlights

Yukiya Miyachi is associated with Fuji Photo Film Company, Limited, where he has been instrumental in advancing thermal recording technologies. His work has been recognized for its practical applications in improving the quality and reliability of thermal printing.

Collaborations

Miyachi has collaborated with Satoru Goto, contributing to the development of innovative solutions in the field of thermal recording.

Conclusion

Yukiya Miyachi's contributions to thermal recording technology exemplify the impact of innovative thinking in enhancing product performance and reliability. His patent reflects a commitment to solving practical challenges in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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