Hitachi, Japan

Yukito Koiwa

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yukito Koiwa. Retrieved from https://idiyas.com/inventor/yukito-koiwa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1992

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1 patent (USPTO):Explore Patents

Title: Yukito Koiwa: Innovator in Portable Measurement Technology

Introduction

Yukito Koiwa is a notable inventor based in Hitachi, Japan. He has made significant contributions to the field of measurement technology, particularly with his innovative designs and patents. His work has been instrumental in advancing portable measurement devices.

Latest Patents

Yukito Koiwa holds a patent for a "Portable intensitometer and apparatus for centralized control of." This invention showcases his expertise in creating efficient and user-friendly measurement tools. He has 1 patent to his name, reflecting his commitment to innovation in this area.

Career Highlights

Koiwa is associated with Hitachi, Ltd., a leading company in technology and innovation. His role at Hitachi has allowed him to work on cutting-edge projects that push the boundaries of measurement technology. His contributions have been recognized within the industry, establishing him as a key figure in his field.

Collaborations

Yukito Koiwa has collaborated with talented coworkers such as Masahiro Kondo and Shinji Mitani. These partnerships have fostered a creative environment that encourages the development of new ideas and technologies.

Conclusion

Yukito Koiwa is a prominent inventor whose work in portable measurement technology has made a lasting impact. His patent and collaborations highlight his dedication to innovation and excellence in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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