Nagasaki, Japan

Yukio Takenaga

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Epicrew Corporation. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yukio Takenaga. Retrieved from https://idiyas.com/inventor/yukio-takenaga

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: The Innovations of Yukio Takenaga

Introduction

Yukio Takenaga is a notable inventor based in Nagasaki, Japan. He has made significant contributions to the field of semiconductor technology. His work has led to the development of innovative solutions that enhance the fabrication process of semiconductors.

Latest Patents

Yukio Takenaga holds a patent for a support structure designed for wafers used in semiconductor fabrication. This invention is crucial for improving the efficiency and effectiveness of semiconductor manufacturing processes.

Career Highlights

Yukio Takenaga is currently employed at Epicrew Corporation, where he continues to push the boundaries of technology. His expertise in semiconductor fabrication has made him a valuable asset to the company.

Collaborations

Yukio has collaborated with Akira Okabe, a fellow innovator, to further advance their research and development efforts in the semiconductor industry.

Conclusion

Yukio Takenaga's contributions to semiconductor technology through his patent and work at Epicrew Corporation highlight his role as an influential inventor in the field. His innovations continue to shape the future of semiconductor fabrication.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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