Kodaira, Japan

Yukio Fujiyama

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Bridgestone Corporation. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yukio Fujiyama. Retrieved from https://idiyas.com/inventor/yukio-fujiyama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Innovations by Yukio Fujiyama

Introduction

Yukio Fujiyama is a notable inventor based in Kodaira, Japan. He has made significant contributions to the field of manufacturing quality management through his innovative patent. His work focuses on enhancing the efficiency of information collection and management in manufacturing processes.

Latest Patents

Yukio Fujiyama holds a patent for a "Method of and device for collecting and combining FA information." This invention describes a method for managing multiple steps in product manufacturing using a network. The system is designed to automatically collect desired information based on specific conditions from the working front information generated at each step. Additionally, it tracks time changes in the desired information and combines this data effectively for quality management.

Career Highlights

Fujiyama is currently employed at Bridgestone Corporation, where he applies his expertise in manufacturing and quality management. His innovative approach has contributed to the advancement of automated systems in the industry.

Collaborations

He has collaborated with notable coworkers, including Masaharu Oku and Satoru Shibao, to further enhance the development of his inventions.

Conclusion

Yukio Fujiyama's contributions to the field of manufacturing through his innovative patent demonstrate his commitment to improving quality management systems. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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