Saitama, Japan

Yukio Endo

This inventor holds 1 USPTO granted patent. Top assignee: Citizen Watch Company, Ltd.. Active years: 1989.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yukio Endo. Retrieved from https://idiyas.com/inventor/yukio-endo-ku232qte

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 1989

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Yukio Endo: Innovator in Optical Scanning Technology

Introduction

Yukio Endo is a notable inventor based in Saitama, Japan. He has made significant contributions to the field of optical scanning technology. His innovative designs have paved the way for advancements in various applications.

Latest Patents

Yukio Endo holds a patent for an optical scanner. The invention features a horizontally arranged base plate, a light source unit, and an optical scanning unit that scans a light beam in a repetitive cycle. The optical system conducts the scanning beam to a desired surface for irradiation. The design includes a torsion bar, a rotor with a mirror, and an electromagnetic drive mechanism, allowing for precise scanning along defined planes.

Career Highlights

Endo is associated with Citizen Watch Company, Ltd., where he has applied his expertise in optical technologies. His work has contributed to the development of advanced scanning devices that enhance functionality and efficiency.

Collaborations

Yukio Endo has collaborated with notable colleagues such as Hirofumi Koike and Tadashi Mitsuhashi. Their combined efforts have led to innovative solutions in the optical scanning domain.

Conclusion

Yukio Endo's contributions to optical scanning technology exemplify his innovative spirit and dedication to advancing the field. His patent and collaborations reflect a commitment to excellence in engineering and design.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…