Tokyo, Japan

Yukinobu Kimoto

This inventor holds 2 USPTO granted patents. Top assignee: Nec Corporation. Active years: 2015-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yukinobu Kimoto. Retrieved from https://idiyas.com/inventor/yukinobu-kimoto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.5

ph-index = 2

Forward Citations = 56(Granted Patents)


Company Filing History:


Years Active: 2015-2016

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2 patents (USPTO):Explore Patents

Title: Yukinobu Kimoto: Innovator in Biometric Technology

Introduction

Yukinobu Kimoto is a notable inventor based in Tokyo, Japan. With a keen focus on biometric technology, he has made significant contributions to the field through his innovative designs and patents.

Latest Patents

Kimoto holds two patents, showcasing his expertise in user interfaces and portable technology. His latest patents include a "User interface for a biometric scanner" and a "Portable biometric scanner." These inventions highlight his ability to integrate advanced technology into user-friendly applications.

Career Highlights

Currently, Yukinobu Kimoto is employed at NEC Corporation, where he continues to leverage his skills in the development of biometric solutions. His work not only enhances security measures but also aims to provide seamless interaction between users and technology.

Collaborations

Throughout his career, Kimoto has collaborated with talented individuals such as Fariborz R Beroukhim and John B Dowden. These partnerships have allowed him to expand his horizons and contribute to groundbreaking developments in the biometric sector.

Conclusion

Yukinobu Kimoto stands as a prominent figure in the realm of biometric innovations. With a focus on enhancing user experience through technology, his contributions at NEC Corporation and his patented inventions reflect his commitment to driving progress in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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