Saitama, Japan

Yukiko Uehara

This inventor holds 1 USPTO granted patent. Top assignee: Wako Pure Chemical Industries, Inc.. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yukiko Uehara. Retrieved from https://idiyas.com/inventor/yukiko-uehara-w5qmsxds

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Innovations of Yukiko Uehara

Introduction

Yukiko Uehara is a prominent inventor based in Saitama, Japan. She has made significant contributions to the field of chemical engineering, particularly in the development of innovative materials and processes. Her work has garnered attention for its potential applications in various industries.

Latest Patents

Yukiko Uehara holds a patent for an "Agent for reducing the substrate dependence of resist." This invention addresses critical challenges in the manufacturing processes of electronic components, enhancing the efficiency and reliability of resist materials.

Career Highlights

Uehara is currently employed at Wako Pure Chemical Industries, Inc., where she continues to push the boundaries of chemical research and development. Her expertise in the field has positioned her as a valuable asset to her company and the broader scientific community.

Collaborations

Yukiko has collaborated with notable colleagues, including Hirotoshi Fujie and Tohru Souki. These partnerships have fostered a dynamic research environment, leading to innovative solutions and advancements in their respective fields.

Conclusion

Yukiko Uehara's contributions to chemical engineering and her innovative patent demonstrate her commitment to advancing technology. Her work continues to inspire future generations of inventors and researchers.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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