Suita, Japan

Yukihiro Ayaki

This inventor holds 1 USPTO granted patent. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yukihiro Ayaki. Retrieved from https://idiyas.com/inventor/yukihiro-ayaki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 26(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Yukihiro Ayaki

Introduction

Yukihiro Ayaki is a notable inventor based in Suita, Japan. He has made significant contributions to the field of technology, particularly in the area of image processing. His innovative approach has led to the development of a unique patent that addresses specific challenges in pattern inspection.

Latest Patents

Yukihiro Ayaki holds a patent for a "Method of erasing repeated patterns and pattern defect inspection device." This invention involves capturing an image of a subject for inspection and dividing it into multiple areas. By analyzing density differences between reference pixels and comparison pixels, he determines a specific density difference that is closest to zero. This specific density difference is then applied to the reference density in the image, effectively erasing repeated patterns.

Career Highlights

Ayaki is associated with Matsushita Electric Industrial Co., Ltd., a company renowned for its advancements in electronics and technology. His work has contributed to the company's reputation for innovation and quality in the industry.

Collaborations

He has collaborated with notable coworkers, including Hajime Kawano and Noriaki Yukawa, who have also made significant contributions to their respective fields.

Conclusion

Yukihiro Ayaki's inventive spirit and dedication to technology have led to impactful advancements in image processing. His patent showcases his ability to solve complex problems through innovative solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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