Nagoya, Japan

Yukiharu Ieda

This inventor holds 1 USPTO granted patent. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yukiharu Ieda. Retrieved from https://idiyas.com/inventor/yukiharu-ieda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Innovations of Yukiharu Ieda in Image Decoding Technology.

Introduction

Yukiharu Ieda is a notable inventor based in Nagoya, Japan. He has made significant contributions to the field of image decoding technology. His innovative work has led to the development of a patent that enhances processing speed in image decoding.

Latest Patents

Yukiharu Ieda holds a patent for an "Image decoding apparatus, recording medium which computer can read from, and program which computer can read." This invention provides an image decoding apparatus that realizes speed-up processing of extracting a macroblock remainder (MR) from a fixed length unit. The technology aims to achieve this without increasing costs, making it a valuable advancement in the field.

Career Highlights

Ieda is associated with Matsushita Electric Industrial Co., Ltd., a company known for its innovative electronic products. His work at the company has allowed him to focus on developing technologies that improve image processing capabilities.

Collaborations

He has collaborated with notable coworkers such as Yoshiyuki Wada and Makoto Hirai. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Yukiharu Ieda's contributions to image decoding technology exemplify the impact of innovation in enhancing processing efficiency. His patent reflects a commitment to advancing technology in a cost-effective manner.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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