Yokohama, Japan

Yuki Yanagisako

This inventor holds 1 USPTO granted patent. Top assignee: Fujitsu Semiconductor Limited. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuki Yanagisako. Retrieved from https://idiyas.com/inventor/yuki-yanagisako

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Yuki Yanagisako: Innovator in Semiconductor Technology

Introduction: Yuki Yanagisako is a prominent inventor based in Yokohama, Japan. She has made significant contributions to the field of semiconductor technology. With a focus on innovative solutions, Yuki has developed a patent that enhances the functionality of semiconductor devices.

Latest Patents: Yuki holds a patent for a "Semiconductor device and method of testing semiconductor device." This invention includes an internal circuit designed to receive and output a signal current. Additionally, it features a current mirror unit that outputs a copied current corresponding to the signal current. A test pad is also included, from which the copied current is extracted. This patent showcases her expertise and commitment to advancing semiconductor technology. Yuki has 1 patent to her name.

Career Highlights: Yuki is currently employed at Fujitsu Semiconductor Limited, where she continues to work on cutting-edge semiconductor solutions. Her role at the company allows her to collaborate with other talented professionals in the field.

Collaborations: Yuki has worked alongside notable colleagues, including Takayuki Nakashiro and Tatsuhiro Mizumasa. Their combined efforts contribute to the innovative projects at Fujitsu Semiconductor Limited.

Conclusion: Yuki Yanagisako is a dedicated inventor whose work in semiconductor technology is paving the way for future advancements. Her contributions are vital to the ongoing evolution of the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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