Tokyo, Japan

Yuki Usutani

This inventor holds 2 USPTO granted patents. Top assignee: Nippon Steel Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuki Usutani. Retrieved from https://idiyas.com/inventor/yuki-usutani

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Yuki Usutani: Innovator in Crankshaft Inspection Technology

Introduction

Yuki Usutani is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of crankshaft inspection technology. With a total of 2 patents to his name, Usutani is recognized for his innovative approaches in engineering.

Latest Patents

His latest patents include a method for crankshaft shape inspection, which involves acquiring three-dimensional point cloud data of a crankshaft's surface. The method superposes this data on a surface shape model of the crankshaft, allowing for precise measurements and evaluations. By generating an estimated machined surface and calculating distances between the actual and estimated surfaces, Usutani's method determines whether the machining stock of the crankshaft is sufficient.

Career Highlights

Yuki Usutani is currently employed at Nippon Steel Corporation, where he continues to develop and refine his innovative technologies. His work has garnered attention for its practical applications in manufacturing and quality control.

Collaborations

Usutani collaborates with talented coworkers, including Yoshito Isei and Kousuke Sakai, who contribute to the advancement of their projects.

Conclusion

Yuki Usutani's contributions to crankshaft inspection technology exemplify the impact of innovation in engineering. His patents reflect a commitment to improving manufacturing processes and ensuring quality in production.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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