Tokyo, Japan

Yuki Kurotaki

This inventor holds 1 USPTO granted patent. Top assignee: Ihi Corporation. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuki Kurotaki. Retrieved from https://idiyas.com/inventor/yuki-kurotaki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Yuki Kurotaki: Innovator in Balance Inspection Technology

Introduction

Yuki Kurotaki is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of balance inspection technology. With a focus on innovative solutions, Kurotaki has developed a unique device that enhances the efficiency of balance inspections.

Latest Patents

Kurotaki holds a patent for a balance inspection device. This device includes a bearing housing that supports a rotary shaft, a jig that houses an impeller, a spray nozzle that sprays gas into the impeller housing space, and a gas supply unit. The design allows the spray nozzle to release gas in a direction that opposes the rotational direction of the impeller, improving the inspection process.

Career Highlights

Kurotaki is currently employed at IHI Corporation, where she continues to innovate and develop new technologies. Her work has been instrumental in advancing balance inspection methods, making them more effective and reliable.

Collaborations

Throughout her career, Kurotaki has collaborated with notable colleagues, including Kenkichi Murata and Seiji Yoshimura. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Yuki Kurotaki is a trailblazer in the field of balance inspection technology, with her innovative patent and collaborative spirit driving advancements in the industry. Her contributions are paving the way for future innovations in this critical area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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