Company Filing History:
Years Active: 2020-2025
Title: Yuki Hasegawa: Innovator in Inspection and Measurement Technologies
Introduction
Yuki Hasegawa is a prominent inventor based in Kyoto, Japan. She has made significant contributions to the fields of inspection and measurement technologies. With a total of 2 patents, her work focuses on enhancing the accuracy and efficiency of product inspections and three-dimensional measurements.
Latest Patents
Hasegawa's latest patents include an inspection apparatus and a three-dimensional measurement apparatus. The inspection apparatus utilizes a first estimation model to extract an attention area from a target image. It then employs a second estimation model to perform computational processes, determining whether a target product has defects based on the results. The first model is trained using images of defect-free products, while the second model is based on images of defective products.
The three-dimensional measurement apparatus features a projecting means that projects patterned light onto a measurement target. This light has a two-dimensionally coded pattern, which is captured by a capturing means. The apparatus calculates the three-dimensional position of a target pixel from the captured image, utilizing a two-fold symmetrical coded pattern.
Career Highlights
Hasegawa is currently employed at Omron Corporation, where she continues to innovate in her field. Her work has been instrumental in developing advanced technologies that improve product quality and measurement accuracy.
Collaborations
Some of her notable coworkers include Masashi Kurita and Sakon Yamamoto, who contribute to her projects and research endeavors.
Conclusion
Yuki Hasegawa's contributions to inspection and measurement technologies highlight her role as a leading inventor in her field. Her innovative patents reflect her commitment to enhancing product quality and measurement precision.