This inventor holds 1 USPTO granted patent and 2 EPO patents. Top assignee: Kawasaki Jukogyo Kabushiki Kaisha. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Yuki Hanawa - Innovator in Inspection Technology
Introduction
Yuki Hanawa is a notable inventor based in Kobe, Japan. She has made significant contributions to the field of inspection technology, particularly with her innovative approach to measuring and analyzing sheet layers. Her work has implications for various industries that require precise inspection methods.
Latest Patents
Yuki Hanawa holds a patent for an "Inspection device and inspection method for sheet layer." This device includes a scanning mechanism equipped with a laser sensor that emits laser slit light to measure two-dimensional shapes. The device features a movement mechanism that allows the laser sensor to move in a predetermined direction. The first recognition unit of the device obtains three-dimensional shape data by associating multiple two-dimensional shape data with the position data of the laser sensor during measurement. The second recognition unit derives the three-dimensional shape of the workpiece by calculating the difference between the shape data before and after the workpiece is laminated on the mold. This innovative inspection method enhances accuracy and efficiency in quality control processes.
Career Highlights
Yuki Hanawa is currently employed at Kawasaki Jukogyo Kabushiki Kaisha, a company known for its advancements in technology and engineering. Her role involves developing and refining inspection technologies that contribute to the company's reputation for quality and innovation.
Collaborations
Yuki collaborates with her coworker, Masataka Koyama, who plays a vital role in supporting her projects and initiatives. Together, they work on enhancing the capabilities of inspection devices and methods.
Conclusion
Yuki Hanawa's contributions to inspection technology through her innovative patent demonstrate her commitment to advancing the field. Her work not only reflects her expertise but also the potential for future developments in quality control processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
