Company Filing History:
2 out of 832,843 Years Active: 2020-2021
Title: Innovations of Yujiang Qin
Introduction
Yujiang Qin is a notable inventor based in Guilin, China. He has made significant contributions to the field of engineering, particularly in the development of advanced scanning devices. With a total of two patents to his name, his work focuses on enhancing the accuracy and efficiency of deflection scanning technologies.
Latest Patents
Yujiang Qin's latest patents include a "Control method for multi-phase winding deflection scanning device" and a "Deflection scanning device with multi-phase winding and deflection scanning system." The control method patent discloses a systematic approach to defining a rectangular coordinate system for deflection scanning tracks. It involves decomposing these tracks into finite point rectangular coordinate data and translating them into resultant exciting current data. This data is further decomposed into n-phase winding exciting current data, which is then converted into corresponding control instruction electrical signals for the drive power supply. The second patent relates to a deflection scanning device that features an axisymmetric structure, designed to improve the uniformity of magnetic induction intensity in charged particle beam channels. This innovation aims to reduce defocusing effects and enhance scanning accuracy.
Career Highlights
Throughout his career, Yujiang Qin has demonstrated a commitment to innovation in the field of scanning technology. His patents reflect a deep understanding of the complexities involved in deflection scanning systems. His work has the potential to significantly impact various applications, particularly in fields requiring precise scanning capabilities.
Collaborations
Yujiang Qin has collaborated with notable colleagues, including Xiaodong Huang and Shouqi Wei. These partnerships have likely contributed to the development and refinement of his innovative technologies.
Conclusion
In summary, Yujiang Qin is a distinguished inventor whose work in deflection scanning technology showcases his expertise and innovative spirit. His patents not only advance the field but also pave the way for future developments in scanning systems.