Saitama, Japan

Yuji Osogawa

This inventor holds 1 USPTO granted patent. Top assignee: Phc Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuji Osogawa. Retrieved from https://idiyas.com/inventor/yuji-osogawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2025

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Yuji Osogawa: Innovator in Testing Instruments

Introduction

Yuji Osogawa is a notable inventor based in Saitama, Japan. He has made significant contributions to the field of testing instruments, showcasing his expertise and innovative spirit. With a focus on developing practical solutions, Osogawa has secured a patent that highlights his commitment to advancing technology.

Latest Patents

Osogawa holds a patent for a testing instrument, which reflects his dedication to improving measurement and testing processes. This invention is a testament to his innovative approach and technical skills. He has achieved 1 patent in his career, demonstrating his ability to create valuable intellectual property.

Career Highlights

Throughout his career, Yuji Osogawa has worked with Phc Corporation, where he has been able to apply his knowledge and skills in a collaborative environment. His role at the company has allowed him to contribute to various projects and initiatives that enhance the company's product offerings.

Collaborations

Osogawa has collaborated with talented coworkers, including Yuta Moriwake and Masakazu Mori. These partnerships have fostered a creative atmosphere that encourages innovation and the development of new ideas.

Conclusion

In summary, Yuji Osogawa is an accomplished inventor whose work in testing instruments has made a significant impact in his field. His patent and collaborations reflect his dedication to innovation and excellence in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…