Tsu, Japan

Yuji Noguchi

This inventor holds 1 USPTO granted patent. Top assignee: Toyota Jidosha Kabushiki Kaisha. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuji Noguchi. Retrieved from https://idiyas.com/inventor/yuji-noguchi-cr0qd2jx

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Yuji Noguchi - Innovator in Plant Resistance Markers

Introduction

Yuji Noguchi is a notable inventor based in Tsu, Japan. He has made significant contributions to the field of plant genetics, particularly in developing markers associated with anthracnose resistance. His work aims to enhance the accuracy of evaluating plant resistance through innovative DNA markers.

Latest Patents

Yuji Noguchi holds a patent for a marker associated with anthracnose resistance in plants of the genus. This invention is designed to develop numerous DNA markers in plants of the genus and to evaluate anthracnose resistance with high accuracy. The markers comprise a continuous nucleic acid region sandwiched between specific nucleotide sequences in the chromosome of the plant.

Career Highlights

Yuji Noguchi is affiliated with Toyota Jidosha Kabushiki Kaisha, where he applies his expertise in plant genetics. His work has been instrumental in advancing the understanding of plant resistance mechanisms, contributing to agricultural innovation.

Collaborations

He has collaborated with notable coworkers, including Momoe Suito and Satoru Nishimura, to further enhance research in this area.

Conclusion

Yuji Noguchi's innovative work in developing DNA markers for anthracnose resistance represents a significant advancement in plant genetics. His contributions are vital for improving agricultural practices and ensuring crop resilience.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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