Tokyo, Japan

Yuji Higo

This inventor holds 5 USPTO granted patents. Top assignee: Organo Corporation. Active years: 2003-2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuji Higo. Retrieved from https://idiyas.com/inventor/yuji-higo-kl3oro97

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 20.0

Average Co-Inventor Count = 1.1

ph-index = 3

Forward Citations = 19(Granted Patents)


Location History:

  • Yokohama, JP (2003)
  • Tokyo, JP (2003 - 2004)

Company Filing History:


Years Active: 2003-2004

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5 patents (USPTO):Explore Patents

Title: Yuji Higo: Innovator in Electric Conductivity Measurement

Introduction

Yuji Higo is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of electric conductivity measurement, holding a total of 5 patents. His innovative work has led to advancements in measuring techniques that enhance accuracy and reliability.

Latest Patents

Higo's latest patents include a "Multiple Electric Conductivity Measuring Apparatus" and an "Apparatus for Measuring Conductivity." The multiple electric conductivity measuring apparatus features at least two measuring cells with electrodes that can detect micro differences in electric conductivity with high sensitivity. The apparatus for measuring conductivity utilizes three electrodes to provide stabilized measurements, ensuring high accuracy in detecting the electric conductivity of various substances.

Career Highlights

Yuji Higo is currently associated with Organo Corporation, where he continues to develop innovative solutions in the field of electric conductivity measurement. His work has been instrumental in advancing measurement technologies that are crucial for various applications.

Collaborations

Higo collaborates with Daisaku Yano, contributing to the development of cutting-edge technologies in their field.

Conclusion

Yuji Higo's contributions to electric conductivity measurement exemplify the impact of innovation in technology. His patents reflect a commitment to enhancing measurement accuracy and reliability, making him a notable figure in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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