Yokohama, Japan

Yuji Hashiya


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: Yuji Hashiya: Innovator in Fault Detection Technology

Introduction

Yuji Hashiya is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of power conversion technology. His innovative work focuses on enhancing the reliability of fault detection in power converters.

Latest Patents

Yuji Hashiya holds a patent for a "Fault detector apparatus having serial fault-detection signal path." This apparatus is designed for power converters that utilize multiple Gate Turn-Off thyristors (GTOs) operating at a predetermined potential. The invention includes a first fault-detecting circuit that generates a fault signal when one of the GTOs malfunctions. Additionally, a second fault-detecting circuit serves a similar purpose for another GTO. The system employs a photocoupler to transmit a DC-isolated optical signal corresponding to the first fault signal. Furthermore, an optical fiber system transmits a DC-isolated output signal, which represents the logical sum of the optical signal and the second fault signal to external circuits.

Career Highlights

Yuji Hashiya is associated with Kabushiki Kaisha Toshiba, a leading company in technology and electronics. His work at Toshiba has allowed him to develop innovative solutions that enhance the performance and safety of power conversion systems. His patent reflects his commitment to advancing technology in this critical area.

Collaborations

Yuji has collaborated with notable colleagues such as Kohsaku Ichikawa and Yukinori Tsuruta. Their combined expertise has contributed to the development of advanced technologies in the field of power electronics.

Conclusion

Yuji Hashiya's contributions to fault detection technology demonstrate his innovative spirit and dedication to improving power conversion systems. His patent showcases the potential for enhanced reliability in electronic devices.

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