Tokyo, Japan

Yuichi Masumoto

This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Electric Corporation. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuichi Masumoto. Retrieved from https://idiyas.com/inventor/yuichi-masumoto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Yuichi Masumoto: Innovator in Film Thickness Measurement

Introduction

Yuichi Masumoto is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of measurement technology, particularly in the development of devices that enhance accuracy and efficiency.

Latest Patents

Masumoto holds a patent for a film thickness measuring apparatus. This innovative device addresses the challenge of noise in light receivers, thereby improving the accuracy of film thickness measurements. The apparatus features a stage that contacts only the end portion of a substrate, a reflection suppressing unit positioned separately from the stage, a light source, and a light receiver. The design ensures that light reflections are minimized, leading to more precise measurements.

Career Highlights

Masumoto is associated with Mitsubishi Electric Corporation, where he has been instrumental in advancing measurement technologies. His work has garnered attention for its practical applications in various industries.

Collaborations

He has collaborated with notable colleagues, including Nobuaki Yamanaka and Toru Jokaku, contributing to a dynamic team focused on innovation.

Conclusion

Yuichi Masumoto's contributions to film thickness measurement technology exemplify the impact of innovative thinking in engineering. His work continues to influence the field and enhance measurement accuracy across various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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