Nara, Japan

Yuho Takahashi

This inventor holds 1 USPTO granted patent. Top assignee: Sharp Kabushiki Kaisha Corporation. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuho Takahashi. Retrieved from https://idiyas.com/inventor/yuho-takahashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 52(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: Yuho Takahashi: Innovator in Chip Component Inspection

Introduction

Yuho Takahashi is a notable inventor based in Nara, Japan. He has made significant contributions to the field of electronics, particularly in the inspection of chip components on printed circuit boards. His innovative approach has led to advancements in ensuring the quality and reliability of electronic devices.

Latest Patents

Takahashi holds a patent for a "Method of and apparatus for inspecting mounting of chip components." This invention involves using two sets of slit light beams to project slit line images in mutually perpendicular directions. By analyzing the discontinuities in the projected slit beam image patterns caused by the edges of mounted chip components, the positions, sizes, and orientations of individual components can be accurately calculated. This method allows for efficient verification of whether chip components are properly mounted on printed circuit boards.

Career Highlights

Throughout his career, Yuho Takahashi has been associated with Sharp Kabushiki Kaisha Corporation, where he has worked alongside talented colleagues such as Shin Kishimoto and Toshihide Morimoto. His work has been instrumental in enhancing the manufacturing processes within the company.

Collaborations

Due to space constraints, the details of collaborations will not be included.

Conclusion

Yuho Takahashi's contributions to the field of chip component inspection exemplify the importance of innovation in electronics. His patented methods continue to influence the industry, ensuring the quality of electronic devices worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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