Longtan, Taiwan

Yuh-Rur Kuo

This inventor holds 1 USPTO granted patent and 4 published patent applications. Top assignee: Cmc Magnetics Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuh-Rur Kuo. Retrieved from https://idiyas.com/inventor/yuh-rur-kuo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Yuh-Rur Kuo: Innovator in Optical Recording Media

Introduction

Yuh-Rur Kuo is a notable inventor based in Longtan, Taiwan. He has made significant contributions to the field of optical recording media. His innovative work has led to the development of advanced technologies that enhance data storage capabilities.

Latest Patents

Yuh-Rur Kuo holds 1 patent for his invention titled "Recordable Optical Recording Media." This patent describes a recordable optical recording media that features an inorganic recording layer created through magnetic sputtering. The recording layer is a combination film that includes primary components such as copper (Cu), silicon (Si), and chromium (Cr). The technology allows for data recording by altering the micro-structure of the recording layer when exposed to a laser beam.

Career Highlights

Kuo is currently employed at CMC Magnetics Corporation, a leading company in the optical storage industry. His work at CMC Magnetics has positioned him as a key player in the development of innovative recording technologies.

Collaborations

Yuh-Rur Kuo collaborates with talented individuals such as Su-Hsuan Chang and Han-Feng Chang. Their teamwork contributes to the advancement of optical recording technologies.

Conclusion

Yuh-Rur Kuo's contributions to the field of optical recording media demonstrate his innovative spirit and dedication to advancing technology. His work continues to influence the industry and pave the way for future developments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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