Hubei, China

Yufeng Liu

This inventor holds 1 USPTO granted patent. Top assignee: Huazhong University of Science and Technology. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yufeng Liu. Retrieved from https://idiyas.com/inventor/yufeng-liu-omea8inu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 6.0

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Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Yufeng Liu: Innovator in Lidar Imaging Technology

Introduction

Yufeng Liu is a prominent inventor based in Hubei, China. He has made significant contributions to the field of lidar imaging technology. His innovative work focuses on improving image quality in challenging environments.

Latest Patents

Yufeng Liu holds a patent for a Gm-APD array lidar imaging method and system under strong background noise. This patent describes a method that involves acquiring two sets of cumulative detection data from the Gm-APD array lidar at different opening times. The process includes performing statistical operations on the data to create cumulative detection result histograms. By determining a range interval of the imaging target, the method enhances laser image quality by mitigating the effects of strong background noise.

Career Highlights

Yufeng Liu is affiliated with Huazhong University of Science and Technology, where he continues to advance research in lidar technology. His work has garnered attention for its practical applications in various fields, including autonomous vehicles and environmental monitoring.

Collaborations

Yufeng Liu collaborates with notable colleagues such as Tianxu Zhang and Hongshi Sang. Their combined expertise contributes to the development of innovative solutions in lidar imaging.

Conclusion

Yufeng Liu's contributions to lidar technology exemplify the impact of innovative thinking in addressing real-world challenges. His work continues to pave the way for advancements in imaging systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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