Beijing, China

Yueqin Liu

This inventor holds 2 USPTO granted patents and 2 EPO patents. Top assignee: China Resources Snow Breweries Company Ltd. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yueqin Liu. Retrieved from https://idiyas.com/inventor/yueqin-liu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Yueqin Liu - Innovator in Forced Oxidation Testing Systems

Introduction

Yueqin Liu is a notable inventor based in Beijing, China. He has made significant contributions to the field of forced oxidation testing systems. His innovative approach has led to the development of a unique patent that enhances testing methodologies.

Latest Patents

Yueqin Liu holds a patent for a Forced Oxidation Test System. This system includes forced oxidation subsystems, a first cabinet, a second cabinet, and connecting devices. The design allows for the inner cavities of adjacent forced oxidation subsystems to be arranged in parallel. The system is engineered to facilitate the testing of packages by ensuring that replacement gas permeates into the to-be-tested packages effectively.

Career Highlights

Throughout his career, Yueqin Liu has worked with prominent organizations, including China Resources Snow Breweries Company Ltd. His experience in these companies has contributed to his expertise in the field of testing systems and innovations.

Collaborations

Yueqin Liu has collaborated with notable colleagues such as Lidong He and Tao Wang. Their combined efforts have further advanced the development of innovative testing solutions.

Conclusion

Yueqin Liu's contributions to forced oxidation testing systems exemplify his dedication to innovation and excellence in his field. His patent and career achievements reflect his commitment to advancing technology in testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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